Mahr MarSurf VD 280 Art. no. 6269022 Surface Roughness and Contour with 280 mm measuring path

The new MarSurf range CD, GD and VD is a precision product offering the highest speed and flexibility.
An improved floor to floor time of up to 65 % provides convincing proof of the speed. The flexibility is highlighted by the large measuring range, the workpiece flexibility (even up to 80 kg) and simple clamping system. It also supports the repeatability and therefore also accuracy. A particular feature of the MarSurf VD is the highly accurate contour and roughness measurement using one system. Simply replace the roughness measuring system and complete highly accurate roughness measurements.
One basis, many advantages
All machines in the MarSurf range run on a common platform.
Short measuring times thanks to high axis speeds and automated measuring sequences
Simple, fast mounting, and changeover thanks to innovative clamping system
Magnetic mount for changing the probe arm quickly without the need for tools
Spacious support plate and large measuring range: ideal for measuring large workpieces

Changing the probe system without tools
The optimized probe systems allows you to achieve highly accurate roughness and contour measurements using a single measuring station:

Changes during operation reduce changeover times
Roughness measurement using the contour probe system can be achieved with very high measuring range at the same time
High level of security thanks to digital interface
Changing the probe system ensures highly accurate roughness measurements are possible

Easy and quick measurements
The simple clamping system positions workpieces safely, quickly and correctly. The measurement itself is completed up to 65% faster due to the fast axes and new probe systems (measured on a pin as an example).

The entire process can be automated with the fast CNC axes and MarWin. This helps to make further savings to the process on site.

MarSurf VD 280 | Art. no. 6269022
Resolution with roughness probe system:
Measuring range 1: 2.0 nm
Measuring range 2: 0.2 nm

with contour probe system:
max. 6 nm (with 210 mm probe arm)
Start of traversing length (in X) 0.1 mm
End of traversing length (in X) 280 mm
Traversing length (Lt) 0.1 – 280 mm
Guide deviation with roughness probe system:
0.20 µm / 60 mm
0.40 µm / 140 mm
0.75 µm / 280 mm
Measuring force (N) with roughness probe system:
0.75 mN

with contour probe system:
4 mN to 30 mN, adjustable via software
Measuring speed 0.02 mm/s to 10 mm/s
Positioning speed X axis 0.02 – 200 mm/s
Positioning speed Z-axis 0.02 – 50 mm/s
Probe Roughness probe system (skidless)
Contour probe system
Probe arm length with roughness probe system:
45 mm to 135 mm

with contour probe system:
210 mm to 490 mm
Workpiece weight max. 90 kg
Other functions manual TY
Measuring range mm with roughness probe system
500 µm (±250 µm) for probe arm length 45 mm
1500 µm (±750 µm) for probe arm length 135 mm

with contour probe system 70 mm with probe arm length 350 mm max. 100 mm with probe arm length 490 mm