Mahr MarSurf CWM 100 3D Measurement System White Light Interferometer Features:
- High precision with sub-nanometer resolution
- Ideal for technical, optical and reflecting surfaces including semiconductor part surfaces and circuit boards
- 2D surface analysis and measurement evaluation
- Topographic 3D surface analysis and measurement evaluation
- Fast measurements – short measuring time
- Microscope field of view is easily enlargeable by fully automated stitching procedure