Mahr MarSurf CWM 100 3D Measurement System White Light Interferometer

Mahr MarSurf CWM 100 3D Measurement System Confocal microscope with integrated white light interferometer. Ideal for technical, optical and reflecting surfaces including semiconductor part surfaces and circuit boards

Metal Surface Analysis –
Laser Structured Surfaces
3D Analysis of Laser Ablation on Steel
3D Analysis of Rough Grinding on Steel
Finely Ground and Structured Steel Surfaces
3D Analysis of Fine Ginding on Steel
Wafer Analysis and Semiconductor Measurement
Roughly Ground and Structured Surfaces
Parts Inspection and Laser Marking
3D Measuring. Evaluation of Aspheres
Roughness Measurement on Optical Surfaces
Measure Diffractive Plastic Optics

Call or email for more information: Ph: 866-945-5742 / email: sales@willrich.com

 

Mahr MarSurf CWM 100 3D Measurement System White Light Interferometer Features:

  • High precision with sub-nanometer resolution
  • Ideal for technical, optical and reflecting surfaces including semiconductor part surfaces and circuit boards
  • 2D surface analysis and measurement evaluation
  • Topographic 3D surface analysis and measurement evaluation
  • Fast measurements – short measuring time
  • Microscope field of view is easily enlargeable by fully automated stitching procedure

Download the product brochure by using the link below:

MarSurf CWM 100

 

 


  help desk software