Mahr MarSurf XCR 20 Features:
• Saves space because both drive units (PCV 200 contour drive unit and GD 25 roughness drive unit) can be adapted using the
corresponding combi-mount on the ST 500 or ST 750 measuring stand
• High-precision contour and roughness evaluation with the MarSurf LD 120 measuring system on components requiring a
large stroke and very high resolution
• Option of rapidly changing between roughness and contour measurements, realized through straightforward changeover
within the software and changing of the mechanical components such as the drive unit and probe
• The CT 200-MOT Y-drive and XT 20 topography software option make it expandable into a topography measuring station.