Sensofar S neox optical profilometer

The new S neox optical profilometer outperforms existing optical 3D profiling microscopes in terms of performance, functionality, efficiency and design, providing Sensofar with a class-leading areal measurement.

The advantages of using a LED over a laser are vast. LEDs avoid interference patterns and scattering typical of laser light sources. LEDs illuminate an area, rather than a single spot, yielding faster measurement. The estimated lifetime of an LED is about 50.000 h (25 times better than a laser). Finally, they offer great versatility, allowing different wavelengths to be used depending on sample requirements.

very S neox is manufactured to deliver accurate and traceable measurements. Systems are calibrated using traceable standards following the ISO 25178 standard part 700 and part 600 for: Z amplification factor, XY lateral dimensions, flatness deviation, system noise as well as parcentricity and parfocality. Any metrology instrument must fulfill it before providing any result.

Sensofar S Lynx 2

The S lynx 2 is a compact and versatile 3D optical system for roughness, volume, and critical dimensions measurements. The advanced stitching capabilities allow you to capture high-resolution data over larger areas. Our innovative algorithms cover the entire motorized stage range, spanning an impressive 125 x 75 mm for the system’s compact size. The small size and compact design of the system allow it to fit into the tightest spaces of your lab or production floor

S neox Five AxisComplete 3D Measurement Solution

The S neox Five Axis 3D Optical profiler combines a high-accuracy rotational module with the advanced inspection and analysis capabilities of the S neox 3D optical profiler. This enables automatic 3D surface measurements at defined positions which can be combined to create a complete 3D volumetric measurement. The Five Axis system makes it possible to take automatic 3D surface measurements at defined positions, and combine them to create a complete 3D volumetric measurement or to inspect the surface finish at specific positions around the sample.

MULTIPLE AXIS POSITIONS
Measurements without limitation
Measuring different parts of the sample with one click is possible thanks to automation routines. A user-friendly interface allows you to find the measurement position without any constraints. Then focus on the critical parts of your sample and add them to the automation routine. Finally click Acquire to obtain all parts measured with one single click. This is an incredibly fast and easy way to automate the measurement routines.

Sensofar S neox

The S neox sensor pushes versatility to the extreme: our 4-in-1 technology, provides unparalleled adaptability for changing application requirements, and maximum measurement flexibility on any surface. The option to add a piezoelectric Z motor makes the S neox our top performer. The S neox sensor also covers thicknesses measurements from 50 nm to 5 mm.

Sensofar S wideLarge Area 3D Profiler

It only takes one second to acquire.
With S wide’s Fringe Projection technology and a suite of different acquisition modes, the measurements can be optimized to achieve the highest throughput.

Starrett W4900 1″ touch screen digital indicator

Starrett W4900 Touchscreen Electronic Indicators (with output)

1″ (25MM), AGD GROUP 4

The new Starrett W4900 Electronic Indicator combines innovation, high versatility and ease-of-use with unparalleled ease of settings navigation. Built for quality labs, inspection areas and in-process applications where access is not always available. This high-end, IP67 indicator can also be used in OEM applications on custom build and design tools and machinery. Electronic Touchscreen Indicator, 1″/25mm Range, .001/.0005/.0001/.00005 in. Resolution, 3/8″ Stem

Mitutoyo Heavy Load Hardness Testers – HV Series

Mitutoyo HV-110/120 System A

  • Equipped with a high performance motorized test force selection function and motorized
    turret mounts.
  • Operates as smoothly as electric models but with the certainty of traditional test forces.
  • A list function makes it easy to perform multi-point and average hardness evaluations which required extra effort or external data processors with conventional manual models. This convenient screen enables consistency of test results.
  • Motorized test force selection and motorized turret positions can be easily controlled via a touch screen control panel. Adjustable X-Y stage with built-in digital micrometers for detailed measurement analysis.HV-110/120 System B,D Advanced models promise additional
    productivity improvements
  • B, and D series testers feature AVPAK dedicated image software enabling automatic
    indentation reading with excellent automatic edge detection capability, reducing
    reading variation and visual error.
  • D series testers add powered X-Y stages which enable automatic continuous testing.
    This allows extended multi-point testing, complex pattern creation and multiple
    workpiece analysis now carried out automatically.
  • D series testers add Auto Focus and create a fully automatic system that dramatically shortens the cycle time of your test and indentation analysis!

V.S – Vickers Scale Additional Components Required for a Complete System

Mitutoyo Linear Gage 100 and Linear Gage 200

LG QuickSetup Tool
A configuration tool is FREE for use with the EJ counter when connected
via the optional USB interface. Multiple settings normally carried out with
counter operating keys can now be easily applied from a computer. Live
displays allow for easily viewing gage positions or measurements at a glance.LG-100 REFERENCE POINT DETECTION

Reference point signal output functions are featured throughout this
series. When incorporating into a device, the master setting value is
easy to set and is retained after shutdown.

 

 

Chatillon Force Gauge DFS

The DFS3 force gauges are advanced, high functionality digital force gauges.  designed for basic and complex applications. These digital force gauges are often used to collect breaking force and peel strength data on test materials, while it allows you to perform statistical analysis on the data directly on the screen.